International Patents
4
US
Apparatus for inspecting a display panel for defects
Hoon Sohn, Sangwoo Choi, Minsang Koo, Sanghyuk Kwon, Eunchul Shin, Woojin Jung, Jiho Park, Soonkyu Hwang
Korea Advanced Institute of Science and Technology
Samsung Display
Application No.
20007490
Publication No.
TBD
3
US
Method of performing visualized measurement on thickness distribution of paint film and apparatus therefor
Hoon Sohn, Soonkyu Hwang, and Jiho Park
Korea Advanced Institute of Science and Technology
Application No.
16307640
Publication No.
TBD
2
China
Active thermography apparatus and method for paint thickness distribution visualization
Hoon Sohn, Soonkyu Hwang, and Jiho Park
Korea Advanced Institute of Science and Technology
Application No.
201880003344.4
Publication No.
TBD
1
US
Surface inspection apparatus for semiconductor chips
Youn Jo Mun, Hoon Sohn, Sang Young Kim, Yun-Kyu An, Sung-Il Cho, Seung Weon Ha, Jinyeol Yang, and Soonkyu Hwang
Korea Advanced Institute of Science and Technology
Samsung Electronics
Application No.
14603809
Publication No.
9500599
Domestic Patents (South Korea)
8
System and method for evaluating coating condition of steel structure
Hoon Sohn, Soonkyu Hwang, Hyunjin Kim, and Hyungjin Lim
Korea Advanced Institute of Science and Technology
Application No.
10-2019-0177318
Publication No.
TBD
7
Examining apparatus and method for the triplex bonding layer
Wonjun Yun, Hoon Sohn, Soonkyu Hwang, Hyungdon Lee, and Sangmin Lee
Korea Advanced Institute of Science and Technology
Hyundai Heavy Industries
Application No.
10-2018-0047857
Publication No.
10-2073243
6
Apparatus for inspecting defections of display panel
Hoon Sohn, Sangwoo Choi, Minsang Koo, Sanghyuk Kwon, Eunchul Shin, Woojin Jung, Jiho Park, Soonkyu Hwang
Korea Advanced Institute of Science and Technology
Samsung Display
Application No.
10-2018-0102513
Publication No.
TBD
5
Active thermography apparatus and method for paint thickness distribution visualization
Hoon Sohn, Soonkyu Hwang, and Jiho Park
Korea Advanced Institute of Science and Technology
(Technology transferred to SQ Engineering)
Application No.
10-2017-0158460
Publication No.
10-1877480
4
Continuous-wave line laser thermography apparatus and method for rotating structure monitoring
Yun-Kyu An and Soonkyu Hwang
Korea Advanced Institute of Science and Technology
Sejong University
Application No.
10-2017-0088582
Publication No.
TBD
3
Continuous line laser beam scanning thermography apparatus and technique for nondestructive evaluation
Yun-Kyu An and Soonkyu Hwang
Korea Advanced Institute of Science and Technology
Sejong University
Application No.
10-2016-0057143
Publication No.
10-1809504
2
Examing apparatus and examining method thereof
Il Kim, Hoon Sohn, Youngjun Moon, Kyung Woon Jang, Chang Kyu Chung, Seong-Woo Choi, Byeongjin Park, Jinyeol Yang, Jaemook Choi, and Soonkyu Hwang
Korea Advanced Institute of Science and Technology
Samsung Electronics
Application No.
10-2015-0045358
Publication No.
TBD
1
Surface inspection apparatus for semiconductor chips and method of inspecting surfaces of semiconductor chips using the same
Youn Jo Mun, Hoon Sohn, Sang Young Kim, Yun-Kyu An, Sung-Il Cho, Seung Weon Ha, Jinyeol Yang, and Soonkyu Hwang
Korea Advanced Institute of Science and Technology
Samsung Electronics
Application No.
10-2015-0011235
Publication No.
TBD